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GB/T 223.21-1994 钢铁及合金化学分析方法 5-CI-PADAB分光光度法测定钴量

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基本信息
标准名称:钢铁及合金化学分析方法 5-CI-PADAB分光光度法测定钴量
英文名称:Methods for chemical analysis of iron steel and alloy.The 5-CL-PADAB spectrophotometric method for the determination of cobalt content
中标分类: 冶金 >> 金属化学分析方法 >> 钢铁与铁合金分析方法
ICS分类: 冶金 >> 黑色金属
替代情况:替代GB 223.21-1982
发布部门:国家技术监督局
发布日期:1994-01-17
实施日期:1994-10-01
首发日期:1963-12-31
作废日期:1900-01-01
主管部门:中国钢铁工业协会
提出单位:中华人民共和国冶金工业部
归口单位:全国钢标准化技术委员会
起草单位:冶金部钢铁研究总院
起草人:王玉兴、孙景义
出版社:中国标准出版社
出版日期:1994-10-01
页数:5页
适用范围

本标准规定了用5-CI-PADAB分光光度法测定钴量。
本标准适用于碳素钢和合金钢中钴量的测定。

前言

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目录

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引用标准

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所属分类: 冶金 金属化学分析方法 钢铁与铁合金分析方法 冶金 黑色金属
Product Code:SAE JA1002
Title:Software Reliability Program Standard
Issuing Committee:G-11 Rmsl Software Committee
Scope:In 1994, the SAE G-11 Reliability, Maintainability, Supportability and Logistics (RMSL) Divisionchartered a software committee, G-11SW, to create several software standards and guidance documents acrossthe RMSL spectrum, including a software reliability program standard. The committee was formed as a crosssection of international representatives from commercial industries and governments.The G-11SW committee has attempted to develop a standard that is consistent with a SAE G-11 system levelreliability program standard and augmented by necessary software-specific support information. The G-11SWcommittee believes this document reflects the best current commercial practices, and meets the objectives of theUnited States Department of Defense Acquisition Reform initiative. This document is performance based and isintended to be used by industries to address market demands for reliable software products that improve systemproductivity, time to market, and cost-effective implementation. As appropriate, governments may also referencethis document.Software has been recognized by SAE G-11 as an important system component that is not adequately addressedat the system level. Software requires interpretation and variations on RMSL methods used by hardware. Thisdocument relies on the simple concept of supplier-customer dialogue and partnership to define, meet, anddemonstrate assurance of software product reliability requirements. This document describes, within a Plan-Caseframework, what performance requirements are necessary. An accompanying implementation guide (SAEJA1003) sets forth current best practices for how to structure the Plan in terms of activities, tasks, and methods soas to achieve the requirements of this document and provide demonstration evidence of reliability achievement inthe form of a Case.Development of this document has required dedication by a few participants and extended review by a wideraudience of potential users. The professionalism of all these individuals and the support they received from theircompanies, governments, and other organizations is gratefully acknowledged.Abstract驴This SAE Standard defines a simple and flexible framework for the performance-based management ofa software reliability program. The principal mechanisms are termed the 驴Software Reliability Plan驴 and the驴Software Reliability Case.驴 The Plan and Case are general purpose management tools which are suitable for usein many fields of system engineering and will be observed throughout SAE RMSL program standards.The Plan and Case in combination provide a means of tracking progress, performance achievement, andsustainment of a reliability goal. The Plan and Case support the philosophy of early fault removal and continuedfault prevention throughout the software life-cycle. The Plan provides a forward view of intended reliabilityprocesses, activities, and performance requirements, while the Case provides evidence of software productreliability achievement as documented by quantitative and qualitative performance measures.【英文标准名称】:Semiconductordevices-TimeDependentDielectricBreakdown(TDDB)testforgatedielectricfilms.
【原文标准名称】:半导体器件.与时间有关的栅极介电薄膜的介质击穿(TDDB)试验
【标准号】:NFC96-017-2008
【标准状态】:现行
【国别】:法国
【发布日期】:2008-01-01
【实施或试行日期】:2008-01-26
【发布单位】:法国标准化协会(AFNOR)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:击穿;检验设备;元部件;定义;介质;电气工程;电子设备及元件;外壳;故障;大门;热室;寿命;测量技术;半导体器件;应力;测试;试验装置;与时间相关的;电压;电压应力
【英文主题词】:
【摘要】:
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:25P;A4
【正文语种】:其他